November 2016 MTT-S Microwave Newsletter
Proof-of-Concept Demonstration of Vector Beam Pattern Measurements of Kinetic Inductance Detectors An international team of researchers from the U.S., the Netherlands, and Japan presents the first vector beam pattern measurement of microwave kinetic inductance detectors (MKIDs). The method should facilitate vector beam pattern measurements using direct detectors, reducing systematic error and allowing near-field as well […]