by Shuxia Yan, Member, IEEE, Yuxing Li, Xiaotong Lu, and Jia Nan Zhang , Member, IEEE
by David L. West
by Yiwen Wang
by Mohammadreza Abbasi
by Emre Akso
by Jinyue Zhang
by Zhiyuan Cao
by Jae-Sung Rieh
by C. Mangiavillano, A. Kaineder, T. Wagner and A. Stelzer
by Z. Kabirkhoo, M. Radpour and L. Belostotski
by Y. Lin, Y. You, S. Shen, J. Huang and Y. Lu