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Status
- Member, TC-3 MICROWAVE MEASUREMENTS, Technical Committees**
Biography
Brian Lee
Employment:
2019-Present Principal Metrology Engineer, National Instruments
2001-2019 Manager of Metrology, Anritsu Company
1999-2001 Manager, Golden Gate Standards Lab/Agilent Technologies (Repair and Calibration)
1997-1999 Manager, Golden Gate Standards Lab/Hewlett Packard
1990-1997 Various management positions including R&D and Planning/Marketing, Center for Measurement Standards/National Measurement Laboratories in Taiwan, Industrial Technology Research Institute.
Assessor for ISO/IEC 17025 Calibration and Testing (including EMC, P25, Energy Star, Medical Devices, Semiconductor, Environmental, etc.), ISO/IEC 17020, ISO/IEC 17065
Uncertainty Analysis Trainer
Lecturer of San Jose State University: MSA, DOE, Quality Management, Reliability, Six Sigma, etc.
IEEE TC Chair for High Frequency Measurement and Connector Standard
ANSI/NCSL Z540 Writing Committee Member and Secretary
IEEE Standard Association Representative and IEC/ANSI Member/National Delegate
Education:
Ph.D. Electrical and Computer Engineering, SUNY at Buffalo, 1990
M.S. Electrical and Computer Engineering, SUNY at Buffalo, 1987
B.S. Electrical and Electronic Engineering, National Cheng Kung University 1983