https://ieeexplore.ieee.org/document/10159519

SWISSto12 material characteristics kit (MCK) that holds a material under test (MUT) between two corrugated horn antennas used to measure transmission and reflection characteristics to estimate the thickness and dielectric properties of the material with a modification of the Baker-Jarvis algorithm.

V band, 50 GHz – 65 GHz

A novel time-gating method derives more information from transmission and reflection measurements by shifting measurement artifacts such as resonances and reflections outside the measured bandwidth. The Baker-Jarvis algorithm is modified to minimize the sum of squared differences instead of the magnitude of the respective determinants for a more reliable estimate of material thickness and dielectric properties.A novel time-gating method derives more information from transmission and reflection measurements by shifting measurement artifacts such as resonances and reflections outside the measured bandwidth. The Baker-Jarvis algorithm is modified to minimize the sum of squared differences instead of the magnitude of the respective determinants for a more reliable estimate of material thickness and dielectric properties.

The modified Baker-Jarvis algorithm estimates are consistently more accurate than the original algorithm estimates for various material samples when compared to mechanical measurements of material thickness and literature references for relative permittivity and loss tangent.