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Date of original webcast
Tuesday, March 8, 2016 -
Duration
59 minutes
Summary
Advances in microwave wafer probes and vector network analyzers now make possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will introduce you to the progress made on this subject at the National Institute of Standards and Technology. He will discuss the fundamental principles behind accurate on-wafer measurements, and show how adhering to these principles has led to the development of accurate on-wafer measurements for transistor characterization at frequencies as high as 1 THz.
Speakers
Dylan Williams received a Ph.D. in Electrical Engineering from the University of California, Berkeley in 1986. He joined the Electromagnetic Fields Division of the National Institute of Standards and Technology in 1989 where he develops electrical waveform and microwave metrology. Dr. Williams has published over 100 technical papers. He is a Fellow of the IEEE, the recipient of the 2013 IEEE Joseph F. Keithley Award, and served as Editor of the IEEE Transactions on Microwave Theory and Techniques.
Dr. Michael C. Hamilton is an Associate Professor in the Electrical and Computer Engineering Department at Auburn University and the Assistant Director of the Alabama Microelectronics Science and Technology Center.