Luciano Boglione was born in Turin, Italy, where he received his Laurea degree in Electronic Engineering from the Politecnico di Torino, Italy. He received his PhD from the Institute of Microwaves, School of Electrical and Electronic Engineering, the University of Leeds, UK, under the supervision of the late Prof. Roger Pollard. He has 20 years of experience in the design and characterization of monolithic microwave and radio frequency integrated circuits (RFICs) fabricated in advanced technologies. His professional experience embraces industry, academia, and government institutions. In 2011, he joined the U.S. Naval Research Laboratory, Washington, DC, USA, where he has been leading efforts to design advanced subsystems in silicon technology for full-duplex applications. In addition, he has continued to develop his long-time interests related to new microwave noise characterization techniques in support of integrated designs. He has published more than 45 articles in peer-reviewed publications and holds two patents. He is also a reviewer of a number of peer-reviewed publications. Dr. Boglione was an elected AdCom Member of the MTT Society for two terms (2007-2012). He is also a member and a past Chair of the MTT-S Microwave Low-Noise Techniques Committee; the 2007 RFIC Conference General Chair and and continues to be an IEEE Volunteer.