Biography
Giovanni Crupi (S’04–M’12–SM’13) received the M.Sc. degree in Electronic Engineering (cum laude) and the Ph.D. degree from the University of Messina, Italy, in 2003 and in 2006, respectively. Since 2005, he has been a repeat Visiting Scientist with KU Leuven and IMEC, Leuven, Belgium. Currently, he is an Associate Professor with the University of Messina, Italy, where he teaches/taught Fundamentals of Electronics, Microwave Electronics, Wireless Technologies, Optoelectronics, and Bioengineering. His main research interests are in the area of microwave electronics engineering, focusing on the characterization and modeling of microwave transistors for circuit design and wireless applications, as well as that of microwave sensors for bioengineering applications.
He has authored/coauthored over 200 publications in international journals and conferences. He has coedited two books published by Elsevier Academic Press: “Microwave De-embedding: From Theory To Applications” (Oxford, UK, 2013) and “Microwave Wireless Communications: From Transistor to System Level” (Oxford, UK, 2016). Dr. Crupi is Editor-in-Chief of the Wiley International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, and also Associate Editor of the journals IEEE Microwave and Wireless Components Letters, IEEE Access, and Wiley International Journal of RF and Microwave Computer-Aided Engineering. He was Guest Editor of four special issues: two in the IEEE Transactions on Microwave Theory and Techniques (in 2014 and 2016) and two in the Wiley International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (in 2014 and 2021). He serves as TPC Member of the IEEE INMMiC, TELSIKS, ICTA, and MMS conferences and was also TPC Chair of the IEEE INMMiC in 2014 and 2015.
Since 2012, he is the Chair of the IEEE MTT-S Graduate Fellowship program, which is one of the longest continuing education-related activities of the IEEE MTT-S and awards up to 12 Annual Fellowships (each in the amount of 6000$ plus 1000$ to attend the IEEE MTT-S IMS in USA) to encourage future leaders and key technical contributors in their pursuit of careers in RF and microwave engineering.