Biography
Florian Bergmann received his Ph.D. in Physics in 2021 from the Johannes Gutenberg University in Mainz, Germany. During his doctorate, he closely collaborated with the Department of Microwave Engineering at the Technical University of Darmstadt and with SCHOTT AG in Mainz on high sensitivity nonlinear characterization of glasses and glass ceramics. He is currently a Postdoctoral Associate at the National Institute of Standards and Technology (NIST) and at the University of Colorado Boulder, both located in Boulder, Colorado, USA. His primary research interests lie in the study of material properties at microwave frequencies and in advancing materials characterization techniques. In 2025, the NIST Communications Technology Laboratory honored him with the “Rising Star” award for his contributions to extending thin film characterization into the mmWave range.