Andrej Rumiantsev received Diploma-Engineer degree (with highest honors) in Telecommunication systems from the Belarusian State University (BSUIR), Minsk, Belarus, and the Dr.-Ing. Degree (with summa cum laude) in Electrical Engineering from Brandenburg University of Technology (BTU) Cottbus, Germany, in 1994 and 2014, respectively.
He joined SUSS MicroTec Test Systems (from 2010 Cascade Microtech) in 2001, where he held various engineering product management and marketing positions. He significantly contributed to developing the RF wafer probes, wafer-level calibration standards, calibration software, and probe systems. Dr. Rumiantsev is currently with MPI Corporation, holding the position of Director of RF Technologies of the Advanced Semiconductor Test Division. His research interests include RF calibration and wafer-level measurement techniques for advanced semiconductor devices. Dr. Rumiantsev is a member of the IEEE MTT-3 Microwave Measurements Committee, the chair of IEEE MTT-S P2822 Working Group “Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements” and the ExCom member of the Automatic RF Techniques Group (ARFTG). He holds multiple patents in wafer-level RF calibration and measurement techniques. His doctoral thesis was awarded as “Best Dissertation of 2014 at Brandenburg.