Biography
Abhijeet Kanitkar is a Scientific Researcher at the Ferdinand-Braun-Institut gGmbH (FBH), Berlin, and a Ph.D. candidate at Technische Universität Berlin. He received the B.E. degree in Electronics and Telecommunication Engineering in 2012 and the M.Sc. degree in Micro and Nano Systems in 2018 from Technische Universität Chemnitz, Germany.
From 2018 to 2022, he was a Scientific Researcher at the Fraunhofer Institute for Reliability and Microintegration (IZM), where his work focused on electromagnetic modeling and simulation of transmission lines and dielectric characterization of materials for wafer-level packaging, printed circuit boards, and semiconductor technologies.
His current research interests include on-wafer characterization and measurement techniques for indium phosphide (InP) transistors, with emphasis on accurate and reliable extraction of high-frequency transistor figures of merit.
He is an Affiliate Member of the IEEE MTT-S TC-3 Microwave Measurements Committee since December 2025.