Electromagnetic Diagnostics for In-situ Metal Additive Manufacturing





Tuesday, Oct 04, 2022
10:30 AM - 12:00 PM (New Delhi Time)

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Electromagnetic Diagnostics for In-situ Metal Additive Manufacturing

Dr. Saptarshi Mukherjee
Lawrence National Laboratory, Livermore, CA, USA

Abstract: Over recent years, advanced manufacturing (AM) of metals has become increasingly sophisticated with finer control of the build part and higher quality material properties. New manufacturing methods have enabled a wide breadth of geometries and feature sizes, which exhibit impressive mechanical and thermal performance characteristics, and are particularly useful for next-generation lightweight and multi-functional engineering applications. Current characterization systems based on x-ray, optical and mechanical interrogation struggle to measure dimensions, phase, and composition in manufacturing-relevant timescales. This motivates the need for new reliable and robust nondestructive measurement approaches that must form the foundation of future manufacturing processes. In this talk I will discuss in-situ electromagnetic diagnostics that were developed at LLNL for real-time characterization of the metal AM process. I will highlight both experimental and computational capabilities at LLNL which were employed to advance these capabilities.

Speaker’s Bio: Dr. Saptarshi Mukherjee received the B.Tech. degree in Electronics and Communication Engineering from the National Institute of Technology, Durgapur, India, in 2013, and the Ph.D. degree in Electrical Engineering from Michigan State University, East Lansing, MI, USA, in 2018. He joined as a Postdoctoral Research Staff member and is currently working as an Applied Electromagnetics Research Scientist at Lawrence Livermore National Laboratory (LLNL). Dr. Mukherjee’s research interests include nondestructive evaluation methods in advanced manufacturing, computational geosciences, imaging and inverse problems and high-power microwave devices. He has authored 3 patents and over 22 technical papers. He is currently serving as an American Society for Nondestructive Testing (ASNT) mentor, committee member of ASNT research and engineering councils, and current chair of the ASNT Golden Gate Section. He has served as the chair of the Electromagnetic Nondestructive Evaluation workshop at LLNL and a session chair for 8 international conferences. He received the National Science Foundation International Research Fellowship in 2015, ASNT Graduate Fellowship award in 2017, ASNT Travel Grant award in 2018 and the Atmospheric Earth & Energy Sciences Directorate (LLNL) stand-out award in 2021.

The event is organized by IEEE MTT-S Student Branch Chapter IIT Kanpur to celebrate the IEEE Day on 4th October, 2022.